Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics
نویسندگان
چکیده
This article describes how to analyse radiation-induced effects using traditional RF metrics in Radio Frequency Integrated Circuits (RFIC) be used the implementation of Software-Defined (SDR). The impact Total Ionizing Dose (TID) and Single Event Effects (SEE) on device characteristics are shown their consequences for a SDR discussed. analysis is based Error Vector Magnitude (EVM), Carrier Offset (CFO), SEE configuration. It has been applied AD9361 Agile transceiver. Experimental results obtained High-Energy Proton Beam 200 MeV at Paul Scherrer Institute. Two different applications analyzed emphasize that radiation can have communication schemes: Quadrature Phase-Shift Keying (QPSK) Amplitude Modulation (64-QAM). Results show Transient (SET) analog circuitry transceiver or Upset (SEU) inside configuration registers lead EVM degradation. In addition, TID frequency drift carrier, generating an offset between transmitter receiver nodes needs taken into account when selecting recovery algorithms receiver.
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 2023
ISSN: ['0018-9499', '1558-1578']
DOI: https://doi.org/10.1109/tns.2023.3270206